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Maya Chip-level testing and recovery for NAND flash

Stop scrapping the most valuable part of every SSD

Most SSD recovery operations discard NAND flash after a controller failure. But NAND is the most valuable part of the drive, and often completely unaffected. MAYA changes the story by extracting, testing, and securely erasing NAND chips, so they can be reused in certified rebuilds.

With MAYA, you reduce dependency on virgin silicon, lower recovery costs, and turn failed devices into reliable, traceable inventory.

MAYA reshapes your entire SSD supply chain.

By converting failed SSDs into reusable inventory, MAYA creates a new input stream for rebuild programs, secure resale channels, and enterprise-grade refurbished product lines. Because each recovered chip is validated and serialized, it can be fed directly into production or sold into traceable secondary markets.

Instead of sourcing all-new silicon, you reclaim what’s already yours, with less spend, less scrap, and full visibility into flash quality over time.

Smarter recovery through data

MAYA turns chip-level test data into actionable recovery insights.

Defect Mapping
Identify patterns in ECC failures and degradation across chip batches.

Supplier Benchmarking
Compare performance across NAND vendors to guide sourcing decisions.

Threshold Tuning
Use yield data to refine rework and recovery parameters.

Design Feedback
Loop real-world results back to engineering for better future SSD designs.

Certified NAND flash data erasure and traceability

Certified NIST 800-88r1 Purge
Meets government and enterprise-grade data sanitization requirements, certified via Kroll Ontrack.

Serialized Audit Trails
Each recovered chip is logged by batch, with time-stamped CSV reports available post-process.

ERP-Integrated Traceability
Automatically flows recovery data into existing QA and inventory systems for closed-loop reporting.

AI-Driven Insights (Planned)
Analytics engine in development to optimize chip yields and flag recurring defect patterns.

See Maya for Yourself

SSDs Rebuilt Using reclaimed NAND

Up to 60%

Lower SSD Cost

NIST 800-88r1

Certified Secure Erasure

Full NAND Spectrum

SLC to 3D QLC across ONFI, Toggle, and legacy variants

Residue Post-Erasure Assurance

How MAYA recovers value others miss

Harvest

01

Failed SSDs are dismantled; NAND chips carefully extracted.

Refurbish

02

Chips are re-balled and reworked via SMD machinery.

Test

03

MAYA performs read/write/erase cycles, ECC checks, and bad block detection.

Secure Erase

04

Certified data purge ensures chips are secure for reuse.

Deploy

05

Chips are vacuum-sealed and redeployed in Vivatronic drives or sold as recovered components.

Common Deployment Questions

Can MAYA recover NAND from SSDs with dead controllers?
Yes. MAYA interfaces directly with the NAND layer, bypassing the controller entirely. This allows recovery of chips that are fully functional but trapped in drives marked as failed due to controller damage.
How does MAYA determine if a chip is reusable?
Each NAND chip undergoes a full diagnostic sequence: read/write/erase cycles, ECC margin testing, and bad block analysis. Chips that meet tolerance thresholds are flagged for reuse, with test logs recorded per batch.
What happens to chips that fail validation?
Failed chips are isolated and logged separately. Depending on defect severity, they may be downcycled into non-critical applications or responsibly recycled.
Is secure erasure automatic or manual?
Erasure is fully automated. Once a chip passes electrical tests, MAYA executes a certified purge sequence (NIST 800-88r1 Level 2) and includes this in the audit report.
Can MAYA be used for sourcing decisions?
Yes. Many teams use MAYA’s yield and defect data to benchmark vendors, track lot-level quality trends, and inform supplier negotiations over time.

Built to Work With

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Rackwipe

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Phoenix

An FPGA-based platform that rapidly tests DDR3/DDR4 memory modules in parallel — up to 10 at once — with deep diagnostics and real-time integration.

Proteus

Our gold standard for HDD and SSD testing and data erasure, featuring ADISA Product Claims Tested erase functionality, flexible configurations (up to 64 test cells), and full audit trails.

RCU Tester

Automated remote control testing for IR, Bluetooth, buttons, LEDs, audio, and more — eliminating manual testing with scalable, fast-cycle execution.

ICT Tester

The ICT is an automated platform for in-circuit and functional testing of small control boards, enabling rapid changeover via swappable upper and lower test probes.

Bujang

Bujang is our proprietary DRAM testing platform engineered for high-volume validation of DDR3/DDR4 modules, delivering early defect detection, real-time performance analytics, and low-cost, high-precision diagnostics at scale.

The PSUT

The PSUT platform delivers precise, customizable testing for power supply units, using advanced electronic loads and analytics to ensure reliability, compliance, and performance at scale.

Ready to start recovering the most valuable part of every SSD?

NAND flash is too expensive to waste. MAYA helps you recover, reuse, and recertify it –securely, at scale.

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